Reliability & resilience
Fault models, checkpointing, remapping, and cross-layer strategies for graceful recovery.
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Research field 04
Dependable Systems · the “-ilities”
How can systems preserve trustworthy behavior when components, workloads, and environments are uncertain?
Perspective
Dependability is broader than fault tolerance. I study how reliability, safety, security, resilience, and sustainability interact with performance, energy, and lifetime in embedded and mixed-criticality systems.
Mixed criticality
Timing and resource-management methods that respect different levels of assurance.
Lifecycle thinking
Design choices that account for operational longevity, energy, resource use, and evolving constraints.
Relevant publications
Selected work in this field.
[DAC '26][MDPI JLPEA '21] [CODES+ISSS '21]
Behnaz Ranjbar, Siva Satyendra Sahoo, Rohit Yalavarthy and Akash Kumar, XRel-Graph: Graph Learning-Driven Cross-Layer Reliability Management in Embedded Mixed-Criticality Systems, Accepted for DAC 2026.
[IEEE TCAD '22]B. Ranjbar, A. Hosseinghorban, S. S. Sahoo, A. Ejlali & A. Kumar. BOT-MICS: Bounding Time Using Analytics in Mixed-Criticality Systems, in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, doi: 10.1109/TCAD.2021.3127867.
S. S. Sahoo, Ranjbar, B., & Kumar, A, Reliability-aware Resource Management in Multi-/Many-core Systems: A Perspective Paper, in MDPI Journal of Low Power Electronics and Applications, 2021.
S. S. Sahoo, A. Kumar, M. Decky, S. C. B. Wong, G. V. Merrett, Y. Zhao, Jiachen Wang, X. Wang & A. K. Singh, Emergent design challenges for embedded systems and paths forward: mixed-criticality, energy, reliability and security perspectives, in Proceedings of the 2021 International Conference on Hardware/Software Codesign and System Synthesis (CODESS, ESWeek 2021). Association for Computing Machinery, New York, NY, USA, 1–10. DOI:https://doi.org/10.1145/3478684.3479246
[VLSI-SoC '21]S. S. Sahoo & A. Kumar, Using Monte Carlo Tree Search for EDA – A Case-study with Designing Cross-layer Reliability for Heterogeneous Embedded Systems, in 2021 IFIP/IEEE 29th International Conference on Very Large Scale Integration (VLSI-SoC 2021), 2021, pp. 1-6, doi: 10.1109/VLSI-SoC53125.2021.9606987.
[DFT '20]S. S. Sahoo, B. Veeravalli and A. Kumar, Markov Chain-based Modeling and Analysis of Checkpointing with Rollback Recovery for Efficient DSE in Soft Real-time Systems. (2020) IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2020), Frascati, Italy, 2020, pp. 1-6, doi: 10.1109/DFT50435.2020.9250892.
[Springer '23]Sahoo, S. S., Das, A. & Kumar, A., Fault-tolerant Architectures. In: Chattopadhyay, A. (eds) Handbook of Computer Architecture. Springer, Singapore. https://doi.org/10.1007/978-981-15-6401-7_11-1.